Docking solution CIS Tester
Product features
32-site image and electrical characteristics integrated CIS Tester
The first Docking interface CIS test solution in China
Highly integrated design, CIS testing can be completed independently and efficiently
China's first 8-channel image capture and electrical characteristics test card
The image capture rate is industry-leading, and the electrical characteristics test function is perfect
Support various common CIS Docking interface connections in the industry
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8 channels CIS Docking Test Card
MIPI C-PHY and D-PHY are compatible, and C-PHY and D-PHY can be switched arbitrarily
MIPI D-PHY rate: up to 2.5Gbps/Lane, support 1/2/4Lane
MIPI C-PHY rate: Up to 2.0Gsps (4.56Gbps)/Trio, support 1/2/3Trio
Sensor power supply: multiple independently adjustable power supplies, all support working current test and standby current test
Electrical performance test: support OS test, DC voltage reading, LP voltage and HS voltage, etc
PC communication interface: RJ450,000 Gigabit Ethernet, up to 10Gbps
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CIS tests product architecture
Adhering to the concept of technological innovation, CZTEK has independently developed a full set of products and solutions from hardware, software, algorithms to test systems, which can quickly build a test environment for the whole process of CIS chip detection for customers
Master the core technology, have a long accumulation in image detection algorithms, and have a large number of successful customer experience in platform adaptation and secondary development, and can provide customers with products and solutions with higher professionalism and matching
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