CIS tests multi-scenario applications

• The first CIS testing machine integrating image, electrical and logic testing in China greatly simplifies the structural complexity of the test machine, reduces the chip test transit process, and improves the test stability

• The built-in acquisition board, digital board, main control board and power board can be configured with different boards to meet a variety of test needs based on different test requirements

• Built-in PIB board, PIB board can be customized for different pin card connections

• It can support 16/32 sites concurrent testing to meet the needs of different customers and scenarios, and the test execution is efficient

CIS tests product architecture

• Adhering to the concept of technological innovation, CZTEK has independently developed a full set of products and solutions from hardware, software, algorithms to test systems, which can quickly build a test environment for the whole process of CIS chip detection for customers 

• Master the core technology, have a long accumulation in image detection algorithms, and have a large number of successful customer experience in platform adaptation and secondary development, and can provide customers with products and solutions with higher professionalism and matching